2011

• "A new stand-alone QEXAFS data acquisition system for in situ studies"
  J. Stötzel, D. Lützenkirchen-Hecht, and R. Frahm, J. Synchrotron Rad., doi:10.1107/S0909049510051897 (2011)

• "Identification of the active species generated from supported Pd catalysts in Heck reactions: An in situ quick scanning EXAFS investigation"
  S. Reimann, J. Stötzel, R. Frahm, W. Kleist, J.-D. Grunwaldt, and A. Baiker, J. Am. Chem. Soc., accepted (2011)

• B. Arezki, G. Schwarz, Y. Bodenthin, D. Lützenkirchen-Hecht, C. Markert, R. Wagner, R. Frahm, D.G. Kurth and U. Pietsch
  "X-Ray near-edge absorption study of temperature-induced low-spin-to-high-spin change in metallo-supramolecular assemblies" ChemPhysChem. 12 (2011), in print.

2010

• Arylamino-functionalized fluorene- and carbazole-based copolymers: Color-tuning their CdTe nanocrystal composites from red to white.
  Kanelidis, I., Ren, Y., Lesnyak, V., Gasse, J.-C., Frahm, R., Eychmüller, A. and Holder, E. (2011), Journal of Polymer Science Part A: Polymer Chemistry, 49: 392–402. doi: 10.1002/pola.24438
• "The dedicated QEXAFS facility at the SLS: Performance and Scientific Opportunities"
  R. Frahm, M. Nachtegaal, J. Stötzel, M. Harfouche, J. A. van Bokhoven, and J.-D. Grunwaldt, AIP Conf. Proc. 1234, 251 (2010)

• "QEXAFS and UV/Vis Simultaneous Monitoring of the TiO2-Nanoparticles Formation by Hydrolytic Sol-Gel Route"
  J. Stötzel, D. Lützenkirchen-Hecht, R. Frahm, C. V. Santilli, S. H. Pulcinelle, R. Kaminski, E. Fonda, F. Villain, and V. Briois, J. Phys. Chem C, 114, 6228 (2010)

• "Hydrothermal Synthesis of Bi₆S₂O₁₅ Nanowires: Structural, in situ EXAFS, and Humidity-Sensing Studies"
  Y. Zhou, J.-D. Grunwaldt, F. Krumeich, K. Zheng, G. Chen, J. Stötzel, R. Frahm, and G. R. Patzke, Small 6, 1173 (2010)

• "Dynamic Structure Changes of a Heterogeneous Catalyst within a Reactor: Oscillations in CO Oxidation over a Supported Platinum Catalyst" J. Singh, M. Nachtegaal, E. M. Alayon, J. Stötzel, and J. A. van Bokhoven, ChemCatChem 2, 653 (2010)

• "A new flexible quick scanning x-ray absorption spectroscopy monochromator setup for time resolved x-ray absorption spectroscopy"
  J. Stötzel, D. Lützenkirchen-Hecht, and R. Frahm, Rev. Sci. Instrum. 81, 073109 (2010)

• D. Lützenkirchen-Hecht and R. Frahm "Requirements for X-ray spectroscopy" Chapter 30 of "Handbook of optics", 3rd edition, vol. V: Atmospheric optics, modulators, fiber optics, X-ray and neutron optics. ed.: M. Bass, C. DeCusatis, J.M. Enoch, V. Lakshminarayanan, G. Li, C. Macdonald, V.N. Mahajan and E. Van Stryland McGraw Hill, New York (2010) 30 (1-6)

• H. Itani, P. Keil, D. Lützenkirchen-Hecht, U. Haake, H. Bongard, A. Dreier, C.W. Lehmann and G. Grundmeier
  "XANES Studies of the Formation of Ag-nanoparticles in LbL deposited polyelectrolyte thin films"
  Surf. Coat. Technol. 205 (2010) 2113 - 2119.
  http://dx.doi.org/10.1016/j.surfcoat.2010.08.104
  
  
• D. Lützenkirchen-Hecht, R. Wagner, A. Herdt and R. Frahm
  "The materials science X-ray beamline BL8 at the DELTA-storage ring"
  AIP Conf. Proc. 1234 (2010) 327 - 330.
  http://link.aip.org/link/?APCPCS/1234/327/1
  
  
• C.G. Schroer, P. Boye, J. Feldkamp, J. Patommel, A. Schropp, D. Samberg, S. Stephan, M. Burghammer, S. Schöder, C. Riekel, B. Lengeler, G. Falkenberg, G. Wellenreuther, M. Kuhlmann, R. Frahm, D. Lützenkirchen-Hecht and W.H. Schröder
  "Hard X-Ray Microscopy with Elemental, Chemical, and Structural Contrast"
  Acta Phys. Pol. A 117 (2010) 357 - 368.
  http://przyrbwn.icm.edu.pl/APP/ABSTR/117/a117-2-51.html
  
  
• W.J.H. Borghols, D. Lützenkirchen-Hecht, U. Haake, W. Chan, U. Lafont, E.M. Kelder, E. van Eck, A.P.M. Kentgens, F. Mulder and M. Wagemaker "Lithium storage in amorphous TiO2 nanoparticles"
  J. Electrochem. Soc. 157 (2010) A 582 - 588.
  http://dx.doi.org/10.1149/1.3332806
  
  
• S. Cammelli, C. Degueldre, A. Cervellino, S. Abolhassani, G. Kuri, J. Bertsch, D. Lützenkirchen-Hecht and R. Frahm
  "Cluster formation, evolution and distribution in FeCu alloy, analysis and simulation by XAFS and XRD"
  Nucl. Instrum. Meth. B 268 (2010) 632 - 637.
  http://dx.doi.org/10.1016/j.nimb.2009.12.008
  
  
• P. Keil, R. Frahm and D. Lützenkirchen-Hecht
  "Native oxidation of sputter deposited polycrystalline copper thin films during short and long exposure times: Comparative investigation by specular and non-specular grazing incidence X-ray absorption spectroscopy"
  Corrosion Sci. 52 (2010) 1305 - 1316.
  http://dx.doi.org/10.1016/j.corsci.2009.12.012
  
  
• H.-H. Strehblow and D. Lützenkirchen-Hecht "Spectroscopies, scattering and diffraction techniques" Chapter 2.31 of "Shreir's Corrosion", Eds. T.J.A. Richardson, B.R.A. Cottis, R. Lindsay, S. Lyon, D.J.D. Scantlebury, H. Stott, M. Graham Elsevier Science Ltd., Oxford (2010) 1374 - 1404.
  
  

2009

• "Structural changes of noble metal catalysts during ignition and extinction of the partial oxidation of methane studied by advanced QEXAFS techniques" J.-D. Grunwaldt, M. Beier, B. Kimmerle, A. Baiker, M. Nachtegaal, B. Griesebock, D. Lützenkirchen-Hecht, J. Stötzel, and R. Frahm, Phys. Chem. Chem. Phys. 11, 8779 (2009)

• "Advancing Time-resolved Methods in Monitoring and Characterization of Catalysts." R. Frahm, J. Stötzel, and D. Lützenkirchen-Hecht, Synchr. Rad. News 22 No. 2, 6-11 (2009)

• "Reduction and re-oxidation of Cu/Al₂O₃ catalysts investigated with quick-scanning XANES and EXAFS" J. Stötzel, D. Lützenkirchen-Hecht, R. Frahm, B. Kimmerle, A. Baiker, M. Nachtegaal, M. J. Beier, and J.-D. Grunwaldt, J. Phys. Conf. Ser. 190, 012153 (2009)

• "Investigation of the ignition behaviour of the noble metal catalyzed catalytic partial oxidation of methane" J. Stötzel, D. Lützenkirchen-Hecht, R. Frahm, B. Kimmerle, A. Baiker, M. Nachtegaal, M. J. Beier, and J.-D. Grunwaldt, J. Phys. Conf. Ser. 190, 012162 (2009)
  
  
• D. Lützenkirchen-Hecht, S. Gertz, C. Markert and R. Frahm "In-situ X-ray investigations of cryocondensed thin gold films." Thin Sol. Films 517 (2009) 3389 - 3397.
  http://dx.doi.org/10.1016/j.tsf.2008.12.033
  
  
• S. Cammelli, C. Degueldre, G. Kuri, J. Bertsch, D. Lützenkirchen-Hecht and R. Frahm "Study of atomic clusters in neutron irradiated reactor pressure vessel surveillance samples by extended x-ray absorption fine structure spectroscopy" J. Nucl. Mat. 385 (2009) 319 - 324.
  http://dx.doi.org/10.1016/j.jnucmat.2008.12.019
  
  
• D. Lützenkirchen-Hecht, R. Wagner, U. Haake, A. Watenphul and R. Frahm "The materials science X-ray beamline BL8 at the DELTA storage ring" J. Synchrotron Rad. 16 (2009) 264 - 272.
  http://dx.doi.org/10.1107/S0909049509000508

• R. Frahm, D. Lützenkirchen-Hecht, M. Jentschel, W. Urban, J. Krempel and K. Schreckenbach "Positron-Electron Pair Creation near Threshold" AIP Conf. Proc. 1090 (2009) 554 - 558.
  http://dx.doi.org/10.1063/1.3087084

• P. Keil and D. Lützenkirchen-Hecht "Surface sensitive reflection mode EXAFS from layered sample systems: The influence of surface and interface roughness" J. Synchrotron Rad. 16 (2009) 443 - 454.
  http://dx.doi.org/10.1107/S0909049509015684

• C. Markert, D. Lützenkirchen-Hecht, R. Wagner and R. Frahm "In-situ surface sensitive X-ray investigations of thin quench condensed bismuth films." Europhys. Lett. 86 (2009) 46007 (1 - 6).
  http://dx.doi.org/10.1209/0295-5075/86/46007

• R. Frahm, D. Lützenkirchen-Hecht, M. Jentschel, W. Urban, J. Krempel and K. Schreckenbach "The Miracle of the Electron-Positron Pair Creation Threshold" Synchrotron Rad. News 22(3) (2009) 28 - 31.

• W.J.H. Borghols, D. Lützenkirchen-Hecht, U. Haake, E.R.H. van Eck, F.M. Mulder and M. Wagemaker "The electronic structure and ionic diffusion of nanoscale LiTiO2 anatase" Phys. Chem. Chem. Phys. 11 (2009) 5742 - 5748.
  http://dx.doi.org/10.1039/B823142G

• C.J. Sahle, C. Sternemann, A. Hohl, R. Wagner, H. Conrad, A. Herdt, O.M. Feroughi, A. Sakko, D. Lützenkirchen-Hecht, R. Frahm, K. Hämäläinen and M. Tolan "Phase separation and nanocrystal formation in GeO" Appl. Phys. Lett. 95 (2009) 021910 (1 - 3).
  http://dx.doi.org/10.1063/1.3183581

• D. Lützenkirchen-Hecht and H.-H. Strehblow "Anodic silver (II) oxides investigated by combined electrochemistry, ex-situ XPS and in-situ X-ray absorption spectroscopy" Surf. Interface Anal. 41 (2009) 820 - 829.
  http://dx.doi.org/10.1002/sia.3106

• S. Cammelli, C. Degueldre, J. Bertsch, D. Lützenkirchen-Hecht and R. Frahm "Polydispersity and EXAFS simulations" J. Phys: Conf. Ser. 190 (2009) 012027 (1-6)
  http://dx.doi.org/10.1088/1742-6596/190/1/012027

• R. Frahm, R. Wagner, A. Herdt, D. Lützenkirchen-Hecht "XAS at the materials science X-ray beamline BL8 at the DELTA storage ring" J. Phys: Conf. Ser. 190 (2009) 012040 (1-4)
  http://dx.doi.org/10.1088/1742-6596/190/1/012040

• D. Lützenkirchen-Hecht, C. Markert, R. Wagner and R. Frahm "In-situ investigation of Bi thin film condensation by surface sensitive X-ray absorption spectroscopy at cryogenic temperatures" J. Phys: Conf. Ser. 190 (2009) 012114 (1-6)
  http://dx.doi.org/10.1088/1742-6596/190/1/012114

2008

• "Novel angular encoder for a quick-extended x-ray absorption finestructure monochromator" J. Stötzel, D. Lützenkirchen-Hecht, E. Fonda, N. de Oliveira, V. Briois, and R. Frahm, Rev. Sci. Instrum. 79, 083107 (2008)

• Microstructure and the grain boundaries evolution in sequential epitaxial buffer layers on RABiTS-Substrates, M. Elmechaouri, B. Mönter, D.Krämer, H. Pusch, W. Jasper, I. Erdman and R. Huehnei J. Phys.: Conf. Ser. 97 012042 (2008), doi: 10.1088/1742-6596/97/1/012042

HASYLAB Annual Report 2007

• In-situ surface sensitive X-ray investigations of quench condensed thin Bismuth-films, C. Markert, D. Lützenkirchen-Hecht, R. Frahm, HASYLAB annual report (2007) 1173-1174

• Electronic properties of nano-scale TiO2 morphologies, W.J.H. Borghols, M. Wagemaker, U. Haake, D. Lützenkirchen-Hecht, HASYLAB annual report (2007) 553-554

• Investigation of doped olivines for cathode materials in rechargeable lithium ion batteries, U. Haake, W.J.H. Borghols, M. Wagemaker, D. Lützenkirchen-Hecht, HASYLAB annual report (2007) 653-654

• Formation of Ag nanoparticles in LbL deposited polyelectrolyte films investigated by means of XAS and UV-Vis spectroscopy, H. Itani, P. Keil, U. Haake, D. Lützenkirchen-Hecht, G. Grundmeier, HASYLAB annual report (2007) 581-582

DELTA Annual Report 2007

• Progress at the Materials Science Beamline 8 at DELTA, D. Lützenkirchen-Hecht, R. Wagner, U. Haake, R. Frahm, DELTA annual report (2007), 11-12

2007

• Selective study of atoms in rough gold surfaces by means of Yoneda-XAFS, P. Keil, D. Lützenkirchen-Hecht and R. Frahm. American Institute of Physics Proceedings 882 (2007) 475 - 477
• XPS investigations of ink-jet printed paper, D. Lützenkirchen-Hecht, K. Rohrmann, T. Stöcker, S.W. Thiel, Surf. Interface Anal. 39 (2007) 845 - 851
• In-situ investigations of Li-ion battery charge and discharge, D. Lützenkirchen-Hecht, Proc. Inter-Academia for Young Researchers & 20st century COE Program Int. Symp. For Young Researchers (2007), Shizuoka Univ., Hamamatsu, Japan (2007) 63
• A magnetron sputtering deposition chamber for in-situ investigation of multilayer film growth using state of the art laboratory diffractometer, C. Ringpfeil, D. Lützenkirchen-Hecht, R. Frahm, Phys. Stat. Sol. a 204 (2007) 2792 – 2797
• Combining non-specular X-ray scattering and X-ray absorption spectroscopy for the investigation of buried layers, D. Lützenkirchen-Hecht, Patrick Keil, Ronald Frahm, Surf. Sci. 601 (2007) 4232 – 4235
• In-Situ Investigations of Magnetron Sputtering Processes with Laboratory X-Ray Equipment, C. Ringpfeil, D. Lützenkirchen-Hecht, R. Frahm, Thin Sol. Films 515 (2007) 5597 – 5600
• Investigation of room temperature oxidation of Cu in air by Yoneda-XAFS, P. Keil, D. Lützenkirchen-Hecht, R. Frahm, American Institute of Physics Proceedings 882 (2007) 490 – 492
• Performance of the First Superconducting Cold-Bore Undulator in an Electron Storage Ring A. Bernhard, S. Casalbuoni, R. Frahm, B. Griesebock, U. Haake, M. Hagelstein, B. Kostka, Y.-L. Mathis, A.-S. Müller, R. Rossmanith, F. Schöck, E. Steffens, M. Weisser, D. Wollmann, T. Baumbach, IEEE Transactions on Applied Superconductivity, Vol. 17, No. 2 (2007) 1235-1238

HASYLAB Annual Report 2006

• Investigation of low temperature oxygen and hydrogen plasma treatments on the surface structure of silver, P. Keil, U. Haake, H. Itani, X. Wang, D. Lützenkirchen-Hecht, R. Frahm, G. Grundmeier, HASYLAB annual report (2006) 571
• Size dependent Li-intercalation in TiO2, D. Lützenkirchen-Hecht, M. Wagemaker and W.J.H. Borghols, HASYLAB annual report (2006) 691
• In-situ surface sensitive X-ray investigations of quench condensed thin metal films, C. Markert, S. Gertz, D. Lützenkirchen-Hecht, R. Frahm, HASYLAB annual report (2006) 903
• Combining non-specular X-ray scattering and X-ray absorption spectroscopy for the investigation of buried layers, D. Lützenkirchen-Hecht, P. Keil and R. Frahm, HASYLAB annual report (2006) 977
• A differentially pumped X-ray window for UHV-applications, D. Lützenkirchen-Hecht, C. Markert, S. Gertz and R. Frahm, HASYLAB annual report (2006) 1375

DELTA Annual Report 2006

• Beamline 8 at DELTA: First user experiments,
  D. Lützenkirchen-Hecht, R. Wagner, S. Cammelli, C. A. Degueldre, B. Arezki, U. Pietsch, R. Frahm,
  DELTA annual report (2006), 12-13
  
• Kinetic two-phase and equilibrium solid solution in spinel Li4+xTi5O12, M. Wagemaker, W.H.J. Borghols, D.R. Simon, E.M. Kelder, J. Schoonman, E.R.H. van Eck, A.P.M. Kentgens, C. Ringpfeil, U. Haake, D. Lützenkirchen-Hecht, R. Frahm, F.M. Mulder, Adv. Mat. 18 (2006) 3169 – 3173
• Structural and electrical properties of thin DC magnetron sputtered gold films on float glass, C. Markert, D. Lützenkirchen-Hecht, R. Frahm, Surf. Interface Anal. 38 (2006) 715 – 718
• First Beam Tests of a Superconductive Undulator in a Storage Ring at ANKA, Bernhard, S. Casalbuoni, R. Frahm, B. Griesebock, U. Haake, M. Hagelstein, M. Kläser, B. Kostka, A.S. Müller, R. Rossmanith, Th. Schneider, F. Schoeck, E. Steffens, M. Weisser, D. Wollmann, T. Baumbach Synchrotron Radiation News, Vol 19, No 3, May/June 2006, 9-17
• The anodic oxidation of silver in 1M NaOH: Electrochemistry, ex-situ XPS and in-situ X-ray absorption spectroscopy, D. Lützenkirchen-Hecht, H.-H. Strehblow, Surf. Interface Anal. 38 (2006) 686 – 690
• In-situ electrochemical lithium intercalation into amorphous oxide thin films, U. Haake, D. Lützenkirchen-Hecht, R. Frahm, Surf. Interface Anal. 38 (2006) 330 – 334
• Time-resolved in-situ investigations of reactive sputtering processes by grazing incidence X-ray absorption spectroscopy, D. Lützenkirchen-Hecht, R. Frahm, Surf. Sci. 600 (2006) 4380 – 4384
• Synchrotron methods for corrosion research, in „Analytical methods in corrosion science and engineering" (invited paper), D. Lützenkirchen-Hecht, H.-H. Strehblow, Eds. P. Marcus and F. Mansfeld, CRC Taylor & Francis, Boca Raton (2006) 169 – 235

2005

ANKA Annual Report 2005

• Operation of First Superconductive Undulator in a Storage Ring at ANKA, A. Bernhard, B. Griesebock, U. Haake, M. Hagelstein, B. Kostka, R. Rossmanith, M. Weißer, D. Wollmanns, T. Baumbach, R. Frahm, E. Steffens,
  ANKA annual report (2005) 141-144

HASYLAB Annual Report 2005

• Investigation of reactively sputtered tungsten oxide thin film growth, U. Haake, D. Lützenkirchen-Hecht, R. Frahm,
  HASYLAB annual report (2005) 404-405


• A surface senitive EXAFS study of the oxidation of Cu at ambient conditions
  P.Keil, D. Lützenlirchen-Hecht, R. Frahm,
  HASYLAB annual report (2005) 721-722


• Preparation and in-situ surface sensitive X-ray investigations of quench condensed thin metal films,
  C. Markert, S. Gertz, D. Lützenkirchen-Hecht, R. Frahm,
  HASYLAB annual report (2005) 1139-1140

• Structure of reactively sputter deposited tin-nitride thin films: A combined XPS, in-situ X-ray reflectivity and EXAFS study,
  D. Lützenkirchen-Hecht, R. Frahm, Thin Solid Films 67 (2005) 493


• A miniaturized multi purpose cell for in-situ investigation of sputtered thin films with X-ray techniques,
  D. Lützenkirchen-Hecht, K. Bruder, U. Haake, P. Keil, C. Markert, C. Ringpfeil, R. Frahm, Rev. Sci. Instrum. 76 (2005) 073905 (1 - 6).
  


• Selective study of atoms in rough surfaces by means of off-specular grazing incidence XAFS,
  P. Keil, D. Lützenkirchen-Hecht and R. Frahm, Europhys. Lett. 71 (2005) 77 - 83.


• A new cell for temperature dependent X-ray absorption spectroscopy of liquid solutions: Application to PbBr2 solutions in diethylene glycol, D. Lützenkirchen-Hecht, T. Oldag, P. Keil, H.-L. Keller and R. Frahm, J. Synchrotron Rad. 12 (2005) 216 - 223.


• Time-resolved study of the oxidation of ethanol by cerium(IV) using combined Quick-XANES, UV-Vis and Raman spectroscopies, V. Briois, D. Lützenkirchen-Hecht, F. Villain, E. Fonda, S. Belin, B. Griesebock and R. Frahm, J. Phys. Chem. A 109 (2005) 320 - 329.


• Reflection mode X-ray absorption spectroscopy: New applications in surface science research, D. Lützenkirchen-Hecht and R. Frahm, Physica B 357 (2005) 213 - 217.


• Grazing incidence XAFS under non-specular conditions, P. Keil, D. Lützenkirchen-Hecht and R. Frahm, Physica B 357 (2005) 1 - 5.


• Tomographic X-ray absorption Spectroscopy, C.G. Schroer, M. Kuhlmann, T.F. Günzler, B. Lengeler, M. Richwin, B. Griesebock, D. Lützenkirchen-Hecht, R. Frahm, E. Ziegler, A. Mashayekhi, D. Haeffner, J.-D. Grunwaldt, A. Baiker and W. Schröder, Physica Scripta T115 (2005) 1026 - 1028.
  


• Recent advances and new applications of time-resolved X-ray absorption spectroscopy, R. Frahm, M. Richwin and D. Lützenkirchen-Hecht, Physica Scripta T115 (2005) 974 - 976.


• Monitoring of fast Transformations in Solid State Chemistry and Heterogeneous Catalysis by QEXAFS in the Second Scale, D. Lützenkirchen-Hecht, J.-D. Grunwaldt, M. Richwin, B. Griesebock, A. Baiker and R. Frahm, Physica Scripta T115 (2005) 831 - 833.


• In situ investigations of thin film formation by reactive sputtering, K. Bruder, P. Keil, D. Lützenkirchen-Hecht and R. Frahm, Physica Scripta T115 (2005) 963 - 965.


• Electrochemical Lithium Intercalation into Transition Metal Oxides, U. Haake, D. Lützenkirchen-Hecht and R. Frahm, Physica Scripta T115 (2005) 559 - 561.


• Calculation of grazing incidence EXAFS: Fresnel theory versus DWBA, P. Keil, D. Lützenkirchen-Hecht and R. Frahm, Physica Scripta T115 (2005) 246 - 248.


• Reflection mode EXAFS at the Ti K-edge of Lithium Intercalated TiO2 Electrodes, D. Lützenkirchen-Hecht, M. Wagemaker, A. A. van Well and R. Frahm, Physica Scripta T115 (2005) 390 - 392.


• Synchrotron methods for corrosion research, D. Lützenkirchen-Hecht and H.-H. Strehblow, Eds. P. Marcus and F. Mansfeld, Marcel Dekker, New York (2005) 169 - 236.

2004

• HASYLAB Annual Report 2004
  • Temperature dependent XAFS investigations of PbBr2 solutions in diehtyleneglycol,
    P. Keil, T. Oldag, D. Lützenkirchen-Hecht, U. Haake, H.-L. Keller and R. Frahm
    HASYLAB annual report (2004) 409
  
  
  • In situ reflection mode EXAFS investigations of the growth of reactively sputtered Ta2O5-thin films,
    D. Lützenkirchen-Hecht, K. Bruder, P. Keil, U. Haake and R. Frahm
    HASYLAB annual report (2004) 499
  
  
  • Grazing incidence XAFS under off-specular conditions,
    P. Keil, D. Lützenkirchen-Hecht and R. Frahm
    HASYLAB annual report (2004) 597
  
  
  • Surface layer formation during lithium intercalation of anatase TiO2: A reflection mode EXAFS study,
    D. Lützenkirchen-Hecht, M. Wagemaker, P. Keil, U. Haake, A.A. van Well and R. Frahm
    HASYLAB annual report (2004) 639
    


• Grazing incidence X-ray absorption spectroscopy of electrochemical interfaces: Basic principles and applications, D. Lützenkirchen-Hecht, Surface Science Research Developments, C.P. Norris (Ed.), Nova Science Publishers, Hauppauge, New York (2004) 139 - 178.


• Tomographic X-ray absorption spectroscopy, C.G. Schroer, M. Kuhlmann, T.F. Günzler, B. Lengeler, M. Richwin, B. Griesebock, D. Lützenkirchen-Hecht, R. Frahm, E. Ziegler, A. Mashayekhi, D. Haeffner, J.-D. Grunwaldt and A. Baiker, Developments in X-ray tomography IV, U. Bonse (Ed.), Proc. SPIE 5535 (2004) 715 - 723.


• Atomic and electronic bulk versus surface structure - Lithium intercalation in anatase TiO2, M. Wagemaker, D. Lützenkirchen-Hecht, A.A. van Well and R. Frahm, J. Phys. Chem. B 108 (2004) 12456 - 12464.
• Status and New Applications of Time-Resolved X-ray Absorption Spectroscopy, R. Frahm, M. Richwin, B. Griesebock and D. Lützenkirchen-Hecht, American Institute of Physics Proceedings 705 (2004) 1411 - 1414.

2003

• ANKA Annual Report 2003
  • Temperature dependent X-ray absorption spectroscopy, P. Keil, C. Markert, R. Wagner, D. Lützenkirchen-Hecht and R. Frahm ANKA annual report (2003) 57


• HASYLAB Annual Report 2003
  • X-ray absorption spectroscopy of PbBr2-solutions,
    P. Keil, T. Ohldag, D. Lützenkirchen-Hecht, H.-L. Keller and R. Frahm
    HASYLAB annual report (2003) 555
  
  
  • Temperature dependent X-ray absorption spectroscopy of Pb,
    P. Keil, D. Lützenkirchen-Hecht and R. Frahm
    HASYLAB annual report (2003) 695
  
  
  • Electrochemical lithium intercalation into amorphous molybdenum oxides,
    U. Haake, D. Lützenkirchen-Hecht and R. Frahm
    HASYLAB annual report (2003) 735
  
  
  • In situ investigations of reactively sputtered Ta-oxide thin film growth,
    K. Bruder, P. Keil, D. Lützenkirchen-Hecht and R. Frahm
    HASYLAB annual report (2003) 751
    


• Quasi-in-situ reflection mode EXAFS at the Ti K-edge of lithium intercalated TiO2 rutile,
  D. Lützenkirchen-Hecht, M. Wagemaker, P. Keil, A. A. van Well and R. Frahm, Surf. Sci. 538 (2003) 10 - 22.
  


• Mapping the chemical states of an element inside a sample using tomographic X-ray absorption spectroscopy,
  C.G. Schroer, M. Kuhlmann, T.F. Günzler, B. Lengeler, M. Richwin, B. Griesebock, D. Lützenkirchen-Hecht, R. Frahm, E. Ziegler, A. Mashayekhi, D. Haeffner, J.-D. Grunwaldt and A. Baiker, Appl. Phys. Lett. 82 (2003) 3360 - 3362.
  


• Quasi-in-situ reflection mode EXAFS at the Ti K-edge of lithium intercalated rutile and mixed anatase/rutile TiO2 thin films,
  M. Wagemaker, D. Lützenkirchen-Hecht, P. Keil, A. A. van Well and R. Frahm, Physica B 336 (2003) 119 - 124.

2002

• APS Activity Report 2002
  • Monitoring of Fast Transformations in Solid-state Chemistry and Heterogeneous Catalysis by QEXAFS in the Second Scale,
    B. Griesebock, D. Lützenkirchen-Hecht, J.-D. Grunwaldt, M. Richwin, A. Baiker and R. Frahm
    APS Activity Report (2002)
  
  
  • Tomographic X-Ray Absorption Spectroscopy,
    B. Griesebock, C.G. Schroer, M. Kuhlmann, T.F. Guenzler, B. Lengeler, M. Richwin, D. Lützenkirchen-Hecht, R. Frahm, J.-D. Grunwaldt, A. Baiker, A. Mashayekhi and D.R. Haeffner
    APS Activity Report (2002)
    


• HASYLAB Annual Report 2002
  • In situ investigations of reactively sputtered Ta-oxide thin film growth,
    P. Keil, K. Bruder, D. Lützenkirchen-Hecht and R. Frahm
    HASYLAB annual report (2002) 287
    
  
  
  • Electrochemical lithium intercalation into transition metal oxides,
    U. Haake, D. Lützenkirchen-Hecht and R. Frahm
    HASYLAB annual report (2002) 623
    
  
  
  • Quasi-in-situ reflection mode EXAFS at the Ti K-edge of lithium intercalated TiO2 electrodes,
    D. Lützenkirchen-Hecht, M. Wagemaker, P. Keil, U. Haake, A.A. van Well and R. Frahm
    HASYLAB annual report (2002) 671
    


• Piezo-XAFS - Time Resolved X-Ray Absorption Spectroscopy,
  M. Richwin, R. Zaeper, D. Lützenkirchen-Hecht, and R. Frahm, Rev. Sci. Instrum. 73 (3), 1668-1670, 2002.
  (Copyright 2002 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The article appeared in Rev. Sci. Instrum. 73 (3), 1668-1670, 2002, and may be found at M. Richwin et. al., Rev. Sci. Instrum. 73 (3), 1668, 2002.)
  


• A Novel Crystal Bender for X-Ray Synchrotron Radiation Monochromators,
  R. Zaeper, M. Richwin, D. Lützenkirchen-Hecht, and R. Frahm, Rev. Sci. Instrum. 73 (3), 1564-1567, 2002.
  (Copyright 2002 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The article appeared in Rev. Sci. Instrum. 73 (3), 1564-1567, 2002, and may be found at R. Zaeper et. al., Rev. Sci. Instrum. 73 (3), 1564, 2002.)

2001

• HASYLAB Annual Report 2001
  • An EXAFS study of Li +-intercalated anatase TiO2,
    D. Lützenkirchen-Hecht, M. Wagemaker, P. Keil, A.A. van Well and R. Frahm
    HASYLAB annual report (2001) 725
    
  
  
  • Reflection mode XAFS under non-specular conditions,
    P. Keil, D. Lützenkirchen-Hecht and R. Frahm
    HASYLAB annual report (2001) 787
    
  
  
  • A cell for quasi in-situ studies of electrode surfaces,
    D. Lützenkirchen-Hecht, M. Wagemaker, P. Keil, U. Haake and A.A. van Well
    HASYLAB annual report (2001) 947
    
  
  
  • Piezo-QEXAFS: Full subsecond EXAFS spectra,
    M. Richwin, D. Lützenkirchen-Hecht and R. Frahm
    HASYLAB annual report (2001) 967
    
• Corrosion of Mo in KOH: Time Resolved XAFS Investigations,
  D. Lützenkirchen-Hecht and R. Frahm, J. Phys. Chem. B 105, 9988-9993, 2001.
  


• Reflectivity studies on a synchrotron radiation mirror in the hard X-Ray regime,
  P. Keil, D. Lützenkirchen-Hecht, D.V. Novikov, U. Hahn, and R. Frahm, Nucl. Instrum. Meth. A 467-468, 275-278, 2001.
  


• Realisation of a Novel Crystal Bender for a Fast Double Crystal Monochromator,
  R. Zaeper, M. Richwin, R. Wollmann, D. Lützenkirchen-Hecht, and R. Frahm, Nucl. Instrum. Meth. A 467-468, 994-997, 2001.
  


• BAMline: the first hard X-ray beamline at BESSY II,
  W. Görner, M. P. Hentschel, B. R. Müller, H. Riesemeier, M. Krumrey, G. Ulm, W. Diete, U. Klein, and R. Frahm, Nucl. Instrum. Meth. A 467-468, 703-706, 2001.
  


• Piezo X-ray Absorption Spectroscopy for the Investigation of Solid-State Transformations in the Millisecond Range,
  J.-D. Grunwaldt, D. Lützenkirchen-Hecht, M. Richwin, S. Grundmann, B. S. Clausen, and R. Frahm, J. Phys. Chem. B 105, 5161-5168, 2001.
  


• Reflection mode XAFS investigations of reactively sputtered thin films,
  D. Lützenkirchen-Hecht and R. Frahm, J. Synchrotron Rad. 8, 478-480, 2001.
  (Legal notice: Copyright © International Union of Crystallography J. Synchrotron Rad. 8, 478-480)
  


• XAFS investigations of tin nitrides,
  D. Lützenkirchen-Hecht, N. Scotti, H. Jacobs, and R. Frahm , J. Synchrotron Rad. 8, 698-700, 2001.
  (Copyright © International Union of Crystallography J. Synchrotron Rad. 8, 698-700)
  


• Piezo-QEXAFS: Advances in Time-Resolved X-Ray Absorption Spectroscopy,
  M. Richwin, R. Zaeper, D. Lützenkirchen-Hecht, and R. Frahm, J. Synchrotron Rad. 8, 254-356, 2001.
  (Copyright © International Union of Crystallography J. Synchrotron Rad. 8, 354-356)
  


• Piezo-QEXAFS with fluorescence detection: Fast time resolved investigation of dilute specimen,
  D. Lützenkirchen-Hecht, S. Grundmann, and R. Frahm, J. Synchrotron Rad. 8, 6-9, 2001.
  (Legal Notice: Copyright © International Union of Crystallography J. Synchrotron Rad. 8, 6-9)

2000

• HASYLAB Annual Report 2000
  • Grazing incidence X-ray reflection and diffuse scattering measurements of float glass surfaces,
    P. Keil, D. Lützenkirchen-Hecht, and R. Frahm, HASYLAB Annual Report 2000.
    
  
  
  • Li intercalation in anatase TiO2 : An EXAFS study,
    D. Lützenkirchen-Hecht, M. Wagemaker, P. Keil, and A. van Well,
    HASYLAB Annual Report 2000.
    
  
  
  • Test of a Novel Crystal Bender,
    M. Richwin, R. Zaeper, D. Lützenkirchen-Hecht, and R. Frahm,
    HASYLAB Annual Report 2000.
    
  
  
  • Radiation Power Measurements at the X-Ray Undulator BW1,
    M. Richwin, R. Zaeper, and R. Frahm, HASYLAB Annual Report 2000.
    
  
  
  • Recent Developments of Piezo-XAFS,
    M. Richwin, R. Zaeper, D. Lützenkirchen-Hecht, and R. Frahm,
    HASYLAB Annual Report 2000.
    
• Improved Piezo-QEXAFS Methods for the Millisecond Time Range,
  M. Richwin, R. Zaeper, D. Lützenkirchen-Hecht, and R. Frahm, in: S. Zelenika (ed.), "Proceedings of the 1st International Workshop on Mechanical Engineering Design of Synchrotron Radiation Equipment and Instrumentation", PSI-Proceedings 00-03, 115-119, 2000. Paul-Scherrer-Institut, Villigen, Switzerland, ISSN 1019-6447.
  


• Structural investigations of sputter deposited thin films: reflection mode EXAFS, specular and non specular X-ray scattering,
  D. Lützenkirchen-Hecht and R. Frahm, Physica B 283, 108-113, 2000.

1999

• HASYLAB Annual Report 1999
  • Reflectivity studies on synchrotron radiation mirrors in the hard X-ray regime,
    P. Keil, D. Lützenkirchen-Hecht, A. Krämer, H. Hammer, M. Richwin, R. Wollmann, and R. Frahm,
    HASYLAB Annual Report 1999
    
  
  
  
  • Reactively sputtered Ta-oxide films: Specular reflectivity, reflection mode EXAFS and non-specular X-ray scattering,
    D. Lützenkirchen-Hecht, A. Krämer, P. Keil, H. Hammer, R. Wollmann and R. Frahm,
    HASYLAB Annual Report 1999
    
  
  
  • Piezo-QEXAFS in fluorescence: Time resolved investigations of dilute specimen,
    D. Lützenkirchen-Hecht, S. Grundmann, H. Hammer, M. Richwin, R. Wollmann, and R. Frahm,
    HASYLAB Annual Report 1999, 1025-1026.
    
  
  
  • Time resolved Pizeo-XAFS investigations of the reduction of Cr(VI),
    M. Richwin, S. Grundmann, D. Lützenkirchen-Hecht, J.-D. Grunwaldt, B. S. Clausen, and R. Frahm,
    HASYLAB Annual Report 1999, 857-858.
• htt/Design and possibilities of the material science beamline at DELTA,
  R. Frahm, R. Wollmann, H. Hammer, and D. Lützenkirchen-Hecht,
  J. Synchrotron Rad. 6, 172-173, 1999.
  


• Time-resolved EXAFS investigations of the anodic dissolution of Mo,
  D. Lützenkirchen-Hecht, and R. Frahm,
  J. Synchrotron Rad. 6, 209-211, 1999.
  


• A new approach for QEXAFS data acquisition,
  H. Bornebusch, B. S. Clausen, G. Steffensen, D. Lützenkirchen-Hecht, and R. Frahm,
  J. Synchrotron Rad. 6, 591-593, 1999.

1998

• Structural investigations of sputtered thin films with x-ray absorption techniques,
  D. Lützenkirchen-Hecht, A. Krämer, H. Hammer, and R. Frahm, Material Science Forum 287-288, 357, 1998.


• Application of combined x-ray diffraction and absorption techniques for in situ catalyst characterization,
  B. S. Clausen, H. Topsøe, and R. Frahm, Advances in Catalysis 42, 315, 1998.
• HASYLAB Annual Report 1998
  • Piezo QEXAFS Method with fluorescence detection,
    S.Grundmann, A.Krämer, D.Lützenkirchen-Hecht, R.Wollmann, and R.Frahm,
    HASYLAB Annual Report 1998.
• [...]

Selected literature on EXAFS

• B.K. Agarwal, X-Ray Spectroscopy: An Introduction, 2nd. ed., Springer Series in Optical Sciences, Springer, 1991.
• B.K. Teo, EXAFS: Basic Principles and Data Analysis, Springer, 1986.